|
|
State-of-the-art analytical infrastructures and engineering capabilities for reliable and high-yielding silicon.
|
 Proven yield management & ramp-up
Altis SC yield management team masters of leading-edge technologies to ensure fast yield ramp-up. All state-of-the-art fab control techniques (Cpk, defect control, clean concept...) are implemented,furthermore systematicproduct e-Beam inspection has been developed to enhance defect capture rate to an unprecedented level. Final test analysis supported by data-mining,physical andelectrical failure analysis techniques enable our experts to identify key yield detractors and react immediately.
Test, Characterization & Failure analysis
The in-house test-floor is a key element in providing quick and reliable data for product quality evaluation in all phases of product development,from prototypedebug to volume production. On site failure analysis department is a key element in technology mastering and achieving shortest time to yield.
Our world class team and laboratories are covering physical analysis and functional characterization. SIMS, Auger, ESCA, TEMs allow a deep understanding of device physics and failure modes. Advanced localization techniques like front/back light emission, liquid crystal hot spot detection, voltage contrast and IDS probes allow quick identification of
functional fails in logic or memory parts of the chip.
Proximate cutting-edge chemical analysis techniques can be provided through the competence center of Air Liquide, one of Altis SC strategic partners being installed on site.
|
 |
EXCELLENCE AND EXPERTISE : TIME TO YIELD